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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [Withdrawn]

DIN EN 60749-10
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 10: Mechanisches Schocken (IEC 60749-10:2002); Deutsche Fassung EN 60749-10:2002

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Responsible international committee

IEC/TC 47 - Semiconductor devices

Edition 2003-04

Original language German

Price from 42.10 €

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Table of contents

Contact

Elena Rongen

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63069 Offenbach am Main

Tel.: +49 69 6308-429

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