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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

EN 60749-3
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2002)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 3: Äußere Sichtprüfung (IEC 60749-3:2002)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2002-08
Original language English
Price On Request
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Table of contents

Contact

Elena Rongen

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63069 Offenbach am Main

Tel.: +49 69 6308-429

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