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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

EN 60747-5-3/A1
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods; Amendment A1 (IEC 60747-5-3:1997/A1:2002)

Title (German)

Einzel-Halbleiterbauelemente und integrierte Schaltungen - Teil 5-3: Optoelektronische Bauelemente; Messverfahren; Änderung A1 (IEC 60747-5-3:1997/A1:2002)

Responsible national committee

DKE/UK 631.1 - Einzel-Halbleiterbauelemente

Edition 2002-05

Original language English

Price On Request

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Table of contents

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

EN 60747-5-3/A1 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods; Amendment A1 (IEC 60747-5-3:1997/A1:2002)

Responsible national committee

Elena Rongen

EN 60747-5-3/A1
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods; Amendment A1 (IEC 60747-5-3:1997/A1:2002)