2. Getting involved
  3. Standards Committees
  4. DKE
NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Standards [CURRENT]

EIA JESD 51-1
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)

Edition 1995-12
Original language English
Price On Request
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