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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [Withdrawn]

DIN EN 60749
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000); German version EN 60749:1999 + A1:2000

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren (IEC 60749:1996 + A1:2000); Deutsche Fassung EN 60749:1999 + A1:2000

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Edition 2001-09
Original language German
Price from 141.20 €
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