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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 60749-5 ; VDE 0884-749-5:2024-09 [New] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-4 | 2017-03 | Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) More |
| DIN EN 60749-4 | 2017-11 | Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017 More |
