NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 60749-20 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-3 | 2017-03 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination More |
| IEC 60749-30 | 2020-08 | Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing More |
| IEC 60749-35 | 2006-07 | Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components More |
