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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN IEC 60749-41 [CURRENT] references following documents:

Document number Edition Title
IEC 60749-23 2004-02 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life More 
IEC 60749-6 2017-03 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature More