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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

DIN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Standardisierte Prüfverfahren für die Zuverlässigkeit von nichtflüchtigen Speicher-Bauelementen (IEC 60749-41:2020); Deutsche Fassung EN IEC 60749-41:2020

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2023-03
Original language German
Price from 112.30 €
Order from DIN Media
Table of contents

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