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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-8 ; VDE 0884-135-8:2022-11 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-20 | 2020-08 | Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat More |
| IEC 60749-20-1 | 2019-06 | Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat More |
| IEC 61760-4 | 2015-05 | Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices More |
| DIN EN IEC 60721-3-1 ; VDE 0468-721-3-1:2018-12 | 2018-12 | Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage (IEC 60721-3-1:2018); German version EN IEC 60721-3-1:2018 More |
| DIN EN IEC 62435-4 ; VDE 0884-135-4:2019-05 | 2019-05 | Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (IEC 62435-4:2018); German version EN IEC 62435-4:2018 More |
| DIN EN IEC 62435-6 ; VDE 0884-135-6:2019-04 | 2019-04 | Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices (IEC 62435-6:2018); German version EN IEC 62435-6:2018 More |
| DIN EN IEC 62435-7 ; VDE 0884-135-7:2022-10 | 2022-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices (IEC 62435-7:2020); German version EN IEC 62435-7:2021 More |
| DIN EN 60749-20-1 | 2009-10 | Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009); German version EN 60749-20-1:2009 More |
| DIN EN 62435-1 ; VDE 0884-135-1:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017); German version EN 62435-1:2017 More |
| DIN EN 62435-2 ; VDE 0884-135-2:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017 More |
