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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN IEC 62435-6 ; VDE 0884-135-6:2019-04 [CURRENT] references following documents:

Document number Edition Title
IPC JEDEC J-STD-033D 2018-03-01 Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices More 
DIN EN 60749-20-1 2009-10 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009); German version EN 60749-20-1:2009 More 
DIN EN 62435-1 ; VDE 0884-135-1:2017-10 2017-10 Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017); German version EN 62435-1:2017 More 
DIN EN 62435-2 ; VDE 0884-135-2:2017-10 2017-10 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017 More 
DIN EN 62435-5 ; VDE 0884-135-5:2017-10 2017-10 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017 More 
DIN ISO 2859-1 2014-08 Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection (ISO 2859-1:1999 + Cor. 1:2001 + Amd.1:2011); Text in German and English More 
IEC 60721-3-1 2018-02 Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage More 
IEC 62435-1 2017-01 Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General More 
IEC 62435-2 2017-01 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms More 
IEC 62435-4 2018-06 Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage More