NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 63041-2 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60050-561 | 2014-11 | International electrotechnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection More |
| IEC 60122-1 ; QC 680000:2002-08 | 2002-08 | Quartz crystal units of assessed quality - Part 1: Generic specification More |
| IEC 60122-2-1 | 1991-07 | Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; section 1: quartz crystal units for microprocessor clock supply More |
| IEC 60444-1 | 1986 | Measurement of quartz crystal unit parameters by zero phase technique in a π-network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network More |
| IEC 60444-9 | 2007-02 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units More |
| IEC 60642 | 1979 | Piezoelectric ceramic resonators and resonator units for frequency control and selection. Chapter I: Standard values and conditions. Chapter II: Measuring and test conditions More |
| IEC 60862-1 | 2015-08 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification More |
| IEC 61019-1 | 2004-11 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification More |
| IEC 61240 | 2016-10 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules More |
| IEC 62276 | 2016-10 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods More |
