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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

SAE J 1752/3
Measurement of Radiated Emissions from Integrated Circuits -TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

Edition 2017-09-22

Original language English

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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

SAE J 1752/3 Measurement of Radiated Emissions from Integrated Circuits -TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

SAE J 1752/3
Measurement of Radiated Emissions from Integrated Circuits -TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)