2. Getting involved
  3. Standards Committees
  4. DKE
NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Standards [CURRENT]

DIN EN 60749-3
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 60749-3:2017); German version EN 60749-3:2017

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 3: Äußere Sichtprüfung (IEC 60749-3:2017); Deutsche Fassung EN 60749-3:2017

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2018-01
Original language German
Price from 85.30 €
Order from DIN Media
Table of contents

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

Send message to contact