NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-5 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-4 | 2017-03 | Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) More |
