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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [Withdrawn]

DIN EN 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 60749-5:2017); Deutsche Fassung EN 60749-5:2017

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2018-01
Original language German
Price from 77.90 €
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Table of contents

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