NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62433-3 ; VDE 0847-33-3:2017-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 62433-2 | 2017-01 | EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) More |
| IEC/TS 61967-3 | 2014-08 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method More |
| DIN IEC/TS 61967-3 ; VDE V 0847-21-3:2015-08 | 2015-08 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014) More |
| IEC 62433-3 | 2017-01 | EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) More |
| ISO 8879 | 1986-10 | Information processing; Text and office systems; Standard Generalized Markup Language (SGML) More |
