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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

DIN EN 60749-6
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur (IEC 60749-6:2017); Deutsche Fassung EN 60749-6:2017

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2017-11
Original language German
Price from 63.80 €
Order from DIN Media
Table of contents

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