NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62433-2 ; VDE 0847-33-2:2017-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| CISPR 17 | 2011-06 | Methods of measurement of the suppression characteristics of passive EMC filtering devices More |
| DIN EN 55017 ; VDE 0565-17:2012-04 | 2012-04 | Methods of measurement of the suppression characteristics of passive EMC filtering devices (CISPR 17:2011); German version EN 55017:2011 More |
| DIN EN 61967-2 | 2006-03 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005 More |
| DIN EN 61967-5 | 2003-10 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003 More |
| DIN EN 61967-6 | 2008-10 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008 More |
| DIN EN 61967-6 Berichtigung 1 | 2011-02 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002) More |
| IEC 61967-2 | 2005-09 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method More |
| IEC 61967-5 | 2003-02 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday cage method More |
| IEC 61967-6 | 2002-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method More |
| IEC 61967-6 AMD 1 | 2008-03 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method; Amendment 1 More |
