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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

IEC 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung

Edition 2017-04
Original language English
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