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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

IEC 60747-5-3
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Title (German)

Einzel-Halbleiterbauelemente und integrierte Schaltungen - Teil 5-3: Optoelektronische Bauelemente - Meßverfahren

Edition 1997-08

Original language English

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Table of contents

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DIN SPEC

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

IEC 60747-5-3 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

IEC 60747-5-3
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods