2. Getting involved
3. Standards Committees
4. DKE

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

Overview

This part of EN 60115 is a generic specification and applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This generic specification and the associated sectional and detail specifications are suitable for use within the scope of a quality assessment system for electronic components, such as the IEC Quality Assessment System for Electronic Components (IECQ). The Technical Data clause covers, among other things, units and symbols, terms, preferred values, marking, coding, and packaging. Each sectional specification shall define the preferred values appropriate to the product group it covers. The Quality Assessment Procedures clause specifies that when this standard and its associated sectional and detail specification are used within the scope of a complete quality assessment system such as the IEC Quality Assessment System for Electronic Components (IECQ), the corresponding clauses from the Quality Assessment Procedures Annex shall apply. The Test and Measurement Procedures clause describes that the sectional specification and/or detail specification form shall contain information on which tests are to be performed, which measurements are to be taken before and after each test or subset of tests, and the order in which they are to be performed. The steps of each test shall be performed in the order specified. The measurement conditions for initial and final measurements shall be the same. Numerous tests are covered in this clause, including standard atmosphere, drying, visual inspection and control of dimensions, resistance value, dielectric strength, temperature dependence of resistance value, nonlinearity, voltage coefficient, current noise, temporary overload, resistance to soldering heat, rapid temperature change, oscillation, endurance test, and test for whisker growth. Normative Annex B provides rules for the preparation of detail specifications for resistors and capacitors for electronic equipment for use in the IECQ system, and Informative Annex C provides an example of test equipment for periodic-pulse high-voltage overload testing. Normative Annex Q describes quality assessment procedures. Informative Annex F contains letter symbols and abbreviations, Informative Annex G the list of clauses on test and measurement procedures. Informative Annex ZA contains an example of a certified test report, Normative Annex ZR details the evaluation, determination and acceptance of the failure rate. The document is rounded off by Informative Annex ZX with the list of references between EN 60115-1:2001 + A1 + A11 and EN 60115-1:2011. The responsible committee is DKE/GK 613 "Widerstände" ("Resistors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

Document: references other documents

Responsible national committee

DKE/GK 613 - Widerstände