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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

DIN EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014

Title (German)

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 22: Elektromechanisches Zug-Prüfverfahren für leitfähige Dünnschichten auf flexiblen Substraten (IEC 62047-22:2014); Deutsche Fassung EN 62047-22:2014

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2015-04
Original language German
Price from 77.90 €
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Table of contents

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