NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62149-8 ; VDE 0886-149-8:2014-11 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-11 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method More |
| IEC 60749-25 | 2003-07 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling More |
| IEC 60749-7 | 2011-06 | Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases More |
| IEC 60825-1 | 2014-05 | Safety of laser products - Part 1: Equipment classification and requirements More |
| IEC 60950-1 | 2005-12 | Information technology equipment - Safety - Part 1: General requirements More |
| IEC 61300-2-19 | 2012-11 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) More |
| IEC 61300-2-48 | 2009-03 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling More |
| DIN EN 60749-11 | 2003-04 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002 More |
| DIN EN 60749-25 | 2004-04 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003); German version EN 60749-25:2003 More |
| DIN EN 60749-7 | 2012-02 | Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2011); German version EN 60749-7:2011 More |
