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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

IEC 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 42: Lagerung bei Wärme und Feuchte

Edition 2014-08

Original language English , French

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

IEC 60749-42 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

IEC 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage