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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-26 ; VDE 0884-749-26:2014-09 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-27 | 2006-07 | Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) More |
| DIN EN 60749-27 | 2013-04 | Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012); German version EN 60749-27:2006 + A1:2012 More |
