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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

EN 60749
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren (IEC 60749:1996)

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Edition 1999-01

Original language English

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Table of contents

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Elena Rongen

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63069 Offenbach am Main

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

EN 60749 Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)

Responsible national committee

Elena Rongen

EN 60749
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)