NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60747-15 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60270 | 2000-12 | High-voltage test techniques - Partial discharge measurements More |
| IEC 60747-7 | 2010-12 | Semiconductor devices - Discrete devices - Part 7: Bipolar transistors More |
| IEC 60747-8 | 2010-12 | Semiconductor devices - Discrete devices - Part 8: Field-effect transistors More |
| IEC 60749-21 | 2011-04 | Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability More |
| IEC 60749-25 | 2003-07 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling More |
| IEC 60749-34 | 2010-10 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling More |
