NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62047-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 62047-8 | 2011-03 | Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films More |
