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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

IEC 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung

Edition 2011-04
Original language English , French
Price On Request
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