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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [CURRENT]

IEC 60749-23 AMD 1
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur

Edition 2011-01

Original language English , French

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Table of contents

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Terminology

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

IEC 60749-23 AMD 1 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

IEC 60749-23 AMD 1
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life