NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62341-1-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 62341-5 | 2009-11 | Organic light emitting diode (OLED) displays - Part 5: Environmental testing methods More |
| ISO 2859-1 | 1999-11 | Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection More |
| ISO 2859-1 Technical Corrigendum 1 | 2001-03 | Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection; Technical Corrigendum 1 More |
| ISO 2859-3 | 2005-05 | Sampling procedures for inspection by attributes - Part 3: Skip-lot sampling procedures More |
| ISO 2859-5 | 2005-06 | Sampling procedures for inspection by attributes - Part 5: System of sequential sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection More |
| QC 001002-2 | 1998-06 | IEC quality assessment system for electronic components (IECQ) - Rules of procedure - Part 2: Documentation More |
| QC 001002-4 | 2008-11 | IEC Quality Assessment System for Electronic Components (IECQ) - Rules of procedure - Part 4: Avionics assessment program requirements More |
| QC 001002-4 AMD 1 | 2009-02 | IEC Quality Assessment System for Electronic Components (IECQ) - Rules of procedure - Part 4: Avionics assessment program requirements - Amendment 1 More |
| QC 001002-5 | 2008-06 | IEC Quality assessment system for Electronic Components (IECQ Scheme) - Rules of procedure - Part 5: Hazardous substance process management requirements (IECQ HSPM) More |
