NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 55016-1-4 ; VDE 0876-16-1-4:2008-09 [Withdrawn] references following documents:
Document number | Edition | Title |
---|---|---|
CISPR/TR 16-4-3 | 2004-05 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-3: Uncertainties, statistics and limit modelling - Statistical considerations in the determination of EMC compliance of mass-produced products More |
CISPR/TR 16-4-3 AMD 1 | 2006-10 | Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-3: Uncertainties, statistics and limit modelling - Statistical considerations in the determination of EMC compliance of mass-produced products More |
CISPR/TR 16-4-3 Edition 2.1 | 2007-01 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-3: Uncertainties, statistics and limit modelling - Statistical considerations in the determination of EMC compliance of mass-produced products More |
CISPR/TR 16-4-5 | 2006-10 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-5: Uncertainties, statistics and limit modelling - Conditions for the use of alternative test methods More |
IEC 60050-161 | 1990-08 | International elektrotechnical vocabulary; chapter 161: electromagnetic compatibility More |
EN 55016-1-1 | 2007-03 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus (CISPR 16-1-1:2006) More |
EN 55016-2-3 | 2006-12 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-3: Methods of measurement of disturbances and immunity - Radiated disturbance measurements (CISPR 16-2-3:2006) More |
EN 55016-4-2 | 2004-10 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 4-2: Uncertainties, statistics and limit modelling - Uncertainty in EMC measurements (CISPR 16-4-2:2003) More |