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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

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Standards [CURRENT]

IEC 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher

Edition 2008-02
Original language English , French
Price On Request
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