NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

Project

Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points

Abstract

This part of IEC 63378 specifies a thermal resistance and capacitance model for semiconductor packages. This model is named the Digital Transformation using thermal Resistance and Capacitance (DXRC) model. It predicts transient temperature at junction and measurement points. This document applies to semiconductor packages such as TO-243, TO-252 and TO-263. It supports single chip packages dissipated heat from single package surface.

Begin

2025-04-23

Planned document number

DIN EN IEC 63378-6

Project number

02233062

Responsible national committee

DKE/UK 631.4 - Gehäuse für Halbleiterbauelemente  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

Send message to contact