NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

Project

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

Abstract

This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).

Begin

2024-12-18

Planned document number

DIN EN IEC 62132-1

Project number

02232801

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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