NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
Abstract
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the early failure assessment, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
Begin
2024-07-10
Planned document number
DIN EN IEC 63287-4
Project number
02232425
