NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Abstract
This part of IEC 60747 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, test environmental condition, test system, test method, and test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.
Begin
2024-04-30
Planned document number
DIN EN IEC 60747-14-12
Project number
02232243
