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Abstract

This document relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis.

Begin

2024-01-24

Planned document number

DIN EN IEC 63185

Project number

02232050

Responsible national committee

DKE/UK 412.4 - Passive HF- und Mikrowellenbauelemente  

previous edition(s)

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 63185:2020); German version EN IEC 63185:2021
2022-10