DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
IEC 61987 - Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange
Abstract
This part of IEC 61987-41 provides a characterization for the integration of process analysers in the Common Data Dictionary (CDD); generic structures in conformance with IEC 61987-10 for Operating Lists of Properties (OLOPs) and Device Lists of Properties (DLOPs) of PAT devices. Generic structures for Dynamic Data, which are needed for condition monitoring of PAT devices. The generic structures for the OLOP and DLOP contain the most important blocks for process analysers. Blocks pertaining to a specific equipment type will be described in the corresponding part of the IEC 61987 standard series. Similarly, equipment properties are not part of this part of IEC 61987. Thus, OLOP, DLOPs and LOPDs for selected PAT device families are to be found in the standards IEC 61987-4x.
Begin
2023-02-08
Planned document number
DIN EN IEC 61987-41
Project number
02231433
