DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023
Abstract
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
Begin
2022-03-22
Planned document number
DIN EN IEC 63364-1
Project number
02230941
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
draft standard
Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021
2023-10
Order from DIN Media
