NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
A global methodology for reliability data prediction of electronic components
Abstract
This part of IEC 63142 establishes a methodology to make a prediction of the failure rate of electronic items, including those encountering multiple stress levels. The methodology is applicable to all domains using electrical, electronic and electromechanical components.
Begin
2021-02-02
Planned document number
DIN EN IEC 63142
Project number
02230042
