NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
IEC 62047-21 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Begin
2013-04-05
Planned document number
IEC 47F/147A/CDV
Responsible national committee
DKE/K 631 - Halbleiterbauelemente