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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Project

Electrical test method for device embedded substrate - general electrical test guide for device embedded substrate with active devices, passive components (Capacitor, Resistor, Inductor, etc), Integrated passive device (IPD), and discrete packages.

Begin

2010-02-26

Planned document number

IEC 91/919/NP

Responsible national committee

DKE/K 682 - Aufbau- und Verbindungstechnik für elektronische Baugruppen

Responsible international committee

IEC/TC 91 - Electronics assembly technology

Contact

Daniel Failer

Merianstr. 28
63069 Offenbach am Main

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Economic benefits

DIN SPEC

Why do standards cost money?

Get involved in standardization

Terminology