2. Getting involved
  3. Standards Committees
  4. DKE
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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Project

IEC 60749-40 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

Begin

2008-05-09

Planned document number

IEC 47/2052/CDV

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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