NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
IEC 60749-29 Ed.2: SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - Part 29: Latch-up test
Begin
2009-09-04
Planned document number
IEC 47/2083/FDIS
Responsible national committee
DKE/K 631 - Halbleiterbauelemente