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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Project

Semiconductor devices - Mechanical and climatic test methods -- Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM)

Begin

2004-03-12

Planned document number

prEN 60749-28

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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