Kurzreferat

Information on how to carry out residual stress measurement by synchrotron diffraction technique is provided as the selection of appropriate diffracting lattice planes on which measurements should be made for different categories of materials, the specimen directions in which the measurements should be performed, the volume of material examined in relation to the material grain size and the envisaged stress state and the selection of the stress-free reference sample to be able to make the residual stress calculation.

Beginn

2022-10-26

WI

00138273

Geplante Dokumentnummer

DIN CEN/TS 18094

Projektnummer

06236396