Norm-Entwurf
OEVE/OENORM EN 60749-28
OEVE/OENORM EN 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) (IEC 47/1751/CDV)
Titel (englisch)
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) (IEC 47/1751/CDV)