Norm
[AKTUELL]
NF B43-410-2
; NF ISO 5618-2:2024-05-22
NF B43-410-2
; NF ISO 5618-2:2024-05-22
Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for GaN crystal surface defects - Part 2: method for determining etch pit density
Titel (englisch)
Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for GaN crystal surface defects - Part 2: method for determining etch pit density